Cisco ONS 15327 Spezifikationen Seite 40

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1-12
Cisco ONS 15454 and Cisco ONS 15327 TL1 Command Guide, R3.3
May 2002
Chapter 1 Getting Started
Test Access
Figure 1-9 Split EF (SPLTEF) access
SPLTEF for T1 (DS1 HCDS) indicates to split both the A and B paths, connect the E side of the accessed
circuit to FAD1 and the dual facility access digroup (DFAD) pair, and connect the F side to the FAD2 of
the same DFAD pair. SPLTEF for T3 (DS3 HCDS) indicates to split both the A and B paths and connect
the E side of the accessed circuit to the odd pair of the FAP and the F side to the even pair of the FAP.
1.8.3 Loop E and F Modes
Loop E and F modes are basically identical to the SPLT E and F modes except that the outgoing signal
is the incoming signal and not the signal from the remote test unit (RTU).
Figure 1-10 LOOPE access
LOOPE indicates to split both the A and B paths, connect the incoming line from the E direction to the
outgoing line in the E direction, and connect this looped configuration to the FAD.
Figure 1-11 LOOPF access
LOOPF indicates to split both the A and B paths, connect the incoming line from the F direction to the
outgoing line in the F direction and connect this looped configuration to the FAD.
61112
A
E
B
F
"Mapped"
AID
AID
Dual-FAD TAP
(2 times the bandwidth
of the circuit accessed)
61113
A
E
B
F
"Mapped"
AID
AID
Dual-FAD TAP
(2 times the bandwidth
of the circuit accessed)
BB
61114
A
E
B
F
"Mapped"
AID
AID
Dual-FAD TAP
(2 times the bandwidth
of the circuit accessed)
BB
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